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[ 特殊顯微鏡設備 | Wafer Probing | 簡易經濟型 4 "用 ]

 ■Analytical Probe Station/4點探針/探針量測儀
   MINI Probe Station 4"/簡易經濟型4"用

 
Model:PE-4

 

 Features

 Compact Size

 Light Weight

 Price Affordable

 Electro-Optics Application

 Light Intensity / Wave Length

 Measurement for LED / LD / PD

 RF Probing East / West

 University Lab. Suitable

 Ideal for small wafer less than 4"

 Side-Driven Chuck Stage

 Backlash-Free Movement

 

 Specifications

 Vacuum Chuck

 4" Stainless Steel

 Chuck Stage

 3" x3" Travel

 Chuck Theta

 0~30 degree

 Platen

 6 Micropositioner

 Requirements

 Electrical

 110 VAC, 60Hz

 Vacuum

 -250 mmHg, 7 liter/min

 Dimensions

 320mmW x 320mmD x 400mmH With Microscope

 Weight 20 Kg  With Microscope

 Accessories

 Chuck Stage Push to Position

 Chuck Stage Vacuum-Based Movement

 Microscope Tilting Mechanism
 And Quick Right Angle Switchover

 Light Intemsity / Wave Length

 Measurment Adapter

 RF Probe / Cables

 Active Probes

 Low Current / Capacitance Probes

 High Voltage Probe

 Ultrasonic Cutter

 CCTV System

 Photomicrographics

 Packaged Device Holder

 PCB Holder

 Thermal Systems

 Liquid Crystal Kit

 Vibration Free TableTOP

 Shielding Box

 Test Bench

 Instrument Case With Caster

 Chuck Vacuum Pattern

 Gold Plated Chuck

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update: 2017-09-19